Invention Grant
US08994371B2 Phase detection in an atomic sensing system 有权
原子感测系统中的相位检测

Phase detection in an atomic sensing system
Abstract:
One embodiment of the invention includes an atomic sensing system. The system includes an atomic sensing device configured to generate an output signal along an output axis in response to a plurality of control parameters. The system also includes a signal generator configured to apply a reference signal to a cross-axis that is approximately orthogonal to the output axis. The system also includes a phase measurement system configured to demodulate the output signal relative to the reference signal to measure a relative phase alignment between the output axis and a physical axis of the atomic sensing device based on the reference signal.
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