Invention Grant
- Patent Title: System and method for controlling charge-up in an electron beam apparatus
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Application No.: US14512583Application Date: 2014-10-13
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Publication No.: US09000369B2Publication Date: 2015-04-07
- Inventor: Weiming Ren , Zhongwei Chen
- Applicant: Hermes Microvision Inc.
- Applicant Address: TW Hsinchu
- Assignee: Hermes Microvision Inc.
- Current Assignee: Hermes Microvision Inc.
- Current Assignee Address: TW Hsinchu
- Agency: WPAT, PC
- Agent Justin King
- Main IPC: H01J37/14
- IPC: H01J37/14 ; H01J37/28

Abstract:
The present invention provides means and corresponding embodiments to control charge-up in an electron beam apparatus, which can eliminate the positive charges soon after being generated on the sample surface within a frame cycle of imaging scanning. The means are to let some or all of secondary electrons emitted from the sample surface return back to neutralize positive charges built up thereon so as to reach a charge balance within a limited time period. The embodiments use control electrodes to generate retarding fields to reflect some of secondary electrons with low kinetic energies back to the sample surface.
Public/Granted literature
- US20150060670A1 System and Method for Controlling Charge-up in an Electron Beam Apparatus Public/Granted day:2015-03-05
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