Invention Grant
- Patent Title: Pattern generator for a lithography system
- Patent Title (中): 光刻系统的图案发生器
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Application No.: US13757477Application Date: 2013-02-01
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Publication No.: US09001308B2Publication Date: 2015-04-07
- Inventor: Chen-Hua Yu , Tien-I Bao , Chih Wei Lu , Jaw-Jung Shin , Shy-Jay Lin , Burn Jeng Lin
- Applicant: Chen-Hua Yu , Tien-I Bao , Chih Wei Lu , Jaw-Jung Shin , Shy-Jay Lin , Burn Jeng Lin
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Haynes and Boone, LLP
- Main IPC: G03F7/20
- IPC: G03F7/20

Abstract:
A pattern generator includes a minor array plate having a mirror, at least one electrode plate disposed over the minor array plate, a lens let disposed over the minor, and at least one insulator layer sandwiched between the mirror array plate and the electrode plate. The electrode plate includes a first conducting layer and a second conducting layer. The lens let has a non-straight sidewall formed in the electrode plate. The pattern generator further includes at least one insulator sandwiched between two electrode plates. The non-straight sidewall can be a U-shaped sidewall or an L-shaped sidewall.
Public/Granted literature
- US20140220494A1 Pattern Generator for a Lithography System Public/Granted day:2014-08-07
Information query
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