Invention Grant
- Patent Title: Method for representing the radiation exposure of an examination area of an object caused by radiological imaging and corresponding imaging device
- Patent Title (中): 用于表示由放射成像引起的物体的检查区域的辐射照射的方法和相应的成像装置
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Application No.: US13528887Application Date: 2012-06-21
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Publication No.: US09001965B2Publication Date: 2015-04-07
- Inventor: Stefan Lautenschläger , Michael Pflaum
- Applicant: Stefan Lautenschläger , Michael Pflaum
- Applicant Address: DE München
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE München
- Priority: DE102011078529 20110701
- Main IPC: G01N23/083
- IPC: G01N23/083 ; H05G1/56 ; A61B6/03 ; A61B6/00
Abstract:
A method for representing an exposure to radiation of an examination area of an object caused by radiological imaging is proposed. A 3D image of the examination area of the object being examined is acquired. Absorption coefficients of the examination area are determined. The radiation exposure of the examination area caused by radiological imaging is determined and is represented in the 3D image. A termination criterion is queried. The radiation exposure of the examination area is iteratively determined till the termination criterion is fulfilled.
Public/Granted literature
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