Invention Grant
- Patent Title: Methods and apparatus for determining brain cortical thickness
- Patent Title (中): 测定脑皮质厚度的方法和装置
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Application No.: US12324498Application Date: 2008-11-26
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Publication No.: US09008394B2Publication Date: 2015-04-14
- Inventor: Zhongmin Steve Lin , Gopal Avinash , Saad Sirohey , Ananth Mohan , Satoshi Minoshima
- Applicant: Zhongmin Steve Lin , Gopal Avinash , Saad Sirohey , Ananth Mohan , Satoshi Minoshima
- Applicant Address: US NY Schenectady US WA Seattle
- Assignee: General Electric Company,University of Washington
- Current Assignee: General Electric Company,University of Washington
- Current Assignee Address: US NY Schenectady US WA Seattle
- Agency: The Small Patent Law Group, LLC
- Agent Dean Small
- Main IPC: A61B5/055
- IPC: A61B5/055 ; A61B5/107
Abstract:
Methods and apparatus for determining brain cortical thickness are provided. One method includes determining an intensity profile at each of a plurality of cortical surface points of an imaged brain using brain tissue image data and calculating a cortical thickness based on a parametrically determined transition point of each intensity profile.
Public/Granted literature
- US20100130848A1 METHODS AND APPARATUS FOR DETERMINING BRAIN CORTICAL THICKNESS Public/Granted day:2010-05-27
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