发明授权
- 专利标题： Global quantitative characterization of patterns using fractal analysis
- 专利标题（中）： 使用分形分析的模式的全局定量表征
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申请号： US11559660申请日： 2006-11-14
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公开(公告)号： US09008452B2公开(公告)日： 2015-04-14
- 发明人: Charles Jaffe , Alfred H. Stiller
- 申请人： Charles Jaffe , Alfred H. Stiller
- 申请人地址： US WV Morgantown
- 专利权人： West Virginia University
- 当前专利权人： West Virginia University
- 当前专利权人地址： US WV Morgantown
- 代理机构： Thomas | Horstemeyer, LLP.
- 主分类号： G06K9/36
- IPC分类号： G06K9/36 ; G06K9/52 ; G06K9/00
摘要：
Various systems, methods, and programs embodied in computer-readable mediums are provided for the global quantitative characterization of patterns. In one representative embodiment, a method is provided in which fractal analysis is performed on a pattern to generate a global quantitative characterization of the pattern in a computer system.
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