Invention Grant
- Patent Title: Capacitive analysis of a moving test material
- Patent Title (中): 移动测试材料的电容分析
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Application No.: US14004006Application Date: 2011-12-14
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Publication No.: US09013194B2Publication Date: 2015-04-21
- Inventor: Reto Gehrig , Karl Bleisch , Beat Koller
- Applicant: Reto Gehrig , Karl Bleisch , Beat Koller
- Applicant Address: CH Uster
- Assignee: Uster Technologies AG
- Current Assignee: Uster Technologies AG
- Current Assignee Address: CH Uster
- Agency: Luedeka Neely Group, P.C.
- Agent Rick Barnes
- Priority: CH418/11 20110311
- International Application: PCT/CH2011/000297 WO 20111214
- International Announcement: WO2012/122661 WO 20120920
- Main IPC: G01R27/26
- IPC: G01R27/26 ; G01B7/16 ; G01D5/24 ; G01N33/36 ; G01N27/22 ; G06K9/00 ; G01L9/12 ; G01C19/5719 ; G01L1/14
Abstract:
The capacitive measuring circuit for a moved elongated test material contains at least two measuring capacitors, each of which is configured for receiving the test material. It further contains electrically actuatable selection means, by means of which one of the measuring capacitors can be selected in such a way that only the selected measuring capacitor contributes to the measurement, whereas the other measuring capacitors do not. As a result, the total capacitance of the measuring circuit is reduced and its sensitivity is increased.
Public/Granted literature
- US20130342225A1 Capacitive Analysis of a Moving Test Material Public/Granted day:2013-12-26
Information query
