发明授权
- 专利标题: Gas analyzing apparatus
- 专利标题(中): 气体分析仪
-
申请号: US13723338申请日: 2012-12-21
-
公开(公告)号: US09013703B2公开(公告)日: 2015-04-21
- 发明人: Toshikazu Ohnishi , Toshiyuki Tsujimoto
- 申请人: Horiba, Ltd.
- 申请人地址: JP Kyoto
- 专利权人: Horiba, Ltd.
- 当前专利权人: Horiba, Ltd.
- 当前专利权人地址: JP Kyoto
- 代理机构: Brooks Kushman P.C.
- 优先权: JP2011-286647 20111227; JP2011-286706 20111227
- 主分类号: G01N21/00
- IPC分类号: G01N21/00 ; G01N21/85 ; G01N21/15 ; G01N21/53
摘要:
A gas analyzing apparatus includes a probe for measuring a concentration of sample gas flowing in a pipe by an optical measurement system. Influence of a thermal lens effect phenomenon is suppressed so that measurement accuracy is improved. The apparatus includes a probe tube disposed to cross a flow path of the sample gas in the pipe to introduce the sample gas flowing in the pipe to a predetermined hollow measurement region. A light emission portion and a light receiving portion for project measurement light to the measurement region in the probe tube and receive the measurement light after passing through the sample gas in the measurement region. A purge gas feed tube disposed in the probe tube supplies purge gas to a region between the optical system members and the measurement region, with a gap to the inner wall surface of the probe tube.
公开/授权文献
- US20130161544A1 GAS ANALYZING APPARATUS 公开/授权日:2013-06-27
信息查询