Invention Grant
US09014335B2 Dual mode small angle scattering camera 有权
双模小角度散射相机

Dual mode small angle scattering camera
Abstract:
A system for analyzing a sample is provided. The system includes a beam selection device for selecting between a one-dimensional operation mode for providing a one-dimensional x-ray beam to the sample and a two-dimensional operation mode for providing a two-dimensional x-ray beam to the sample.
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