Invention Grant
- Patent Title: Testing of non stuck-at faults in memory
- Patent Title (中): 内存中非卡住故障的测试
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Application No.: US13969259Application Date: 2013-08-16
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Publication No.: US09015539B2Publication Date: 2015-04-21
- Inventor: Suraj Prakash
- Applicant: STMicroelectronics International N.V.
- Applicant Address: NL Amsterdam
- Assignee: STMicroelectronics International N.V.
- Current Assignee: STMicroelectronics International N.V.
- Current Assignee Address: NL Amsterdam
- Agency: Allen, Dyer, Doppelt, Milbrath & Gilchrist, P.A.
- Priority: IN2096/DEL/2010 20100903
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C29/10 ; G11C29/50 ; G11C17/00 ; G11C29/04

Abstract:
A method for identifying non stuck-at faults in a read-only memory (ROM) includes generating a golden value of a victim cell, providing a fault-specific pattern through an aggressor cell, generating a test reading of the victim cell in response to the provided fault-specific pattern, and determining whether the ROM has at least one non stuck-at fault. The determination is based on a comparison of the golden value and the test reading of the victim cell.
Public/Granted literature
- US20130332785A1 TESTING OF NON STUCK-AT FAULTS IN MEMORY Public/Granted day:2013-12-12
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