Invention Grant
- Patent Title: Strained transistor structure
- Patent Title (中): 应变晶体管结构
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Application No.: US14164055Application Date: 2014-01-24
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Publication No.: US09018051B2Publication Date: 2015-04-28
- Inventor: Barry Dove
- Applicant: STMicroelectronics, Inc.
- Applicant Address: US TX Coppell
- Assignee: STMicroelectronics, Inc.
- Current Assignee: STMicroelectronics, Inc.
- Current Assignee Address: US TX Coppell
- Agency: Seed IP Law Group PLLC
- Main IPC: H01L21/335
- IPC: H01L21/335 ; H01L29/66 ; H01L21/28 ; H01L23/522 ; H01L29/423 ; H01L29/78

Abstract:
A strain enhanced transistor is provided having a strain inducing layer overlying a gate electrode. The gate electrode has sloped sidewalls over the channel region of the transistor.
Public/Granted literature
- US20140141588A1 STRAINED TRANSISTOR STRUCTURE Public/Granted day:2014-05-22
Information query
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