发明授权
US09018738B2 Silicon layer transfer substrate and method of manufacturing semiconductor substrate 有权
硅层转移基板和半导体基板的制造方法

  • 专利标题: Silicon layer transfer substrate and method of manufacturing semiconductor substrate
  • 专利标题(中): 硅层转移基板和半导体基板的制造方法
  • 申请号: US13365794
    申请日: 2012-02-03
  • 公开(公告)号: US09018738B2
    公开(公告)日: 2015-04-28
  • 发明人: Minoru Mitsui
  • 申请人: Minoru Mitsui
  • 申请人地址: JP Tokyo
  • 专利权人: Fuji Xerox Co., Ltd.
  • 当前专利权人: Fuji Xerox Co., Ltd.
  • 当前专利权人地址: JP Tokyo
  • 代理机构: Oliff PLC
  • 优先权: JP2011-61609 20110318; JP2011-167678 20110729
  • 主分类号: H01L29/06
  • IPC分类号: H01L29/06 H01L21/20 H01L21/762 H01L21/02
Silicon layer transfer substrate and method of manufacturing semiconductor substrate
摘要:
A silicon layer transfer substrate includes a silicon substrate of a first substrate, a sacrificial layer, and a transfer silicon layer transferred to a second substrate, wherein the sacrificial layer has a silicon compound layer containing a compound of silicon and at least one element selected from a group consisting of germanium and carbon, and is provided on the silicon substrate of the first substrate, the silicon compound layer having a thickness equal to or smaller than a critical film thickness, the transfer silicon layer transferred to the second substrate is provided on the sacrificial layer, and at least either the silicon substrate or the silicon layer has a groove or a hole connected to the sacrificial layer.
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