发明授权
- 专利标题： Method of calculating accuracy of measuring location, and method and apparatus for measuring location of terminal using accuracy of measuring location
- 专利标题（中）： 测量位置精度的计算方法以及测量位置的测量位置的方法和装置
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申请号： US13600956申请日： 2012-08-31
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公开(公告)号： US09026361B2公开(公告)日： 2015-05-05
- 发明人: Eung Sun Kim , Dohyung Park , Yong Kim
- 申请人： Eung Sun Kim , Dohyung Park , Yong Kim
- 申请人地址： KR Suwon-si
- 专利权人： Samsung Electronics Co., Ltd.
- 当前专利权人： Samsung Electronics Co., Ltd.
- 当前专利权人地址： KR Suwon-si
- 代理机构： NSIP Law
- 优先权： KR10-2011-0096908 20110926
- 主分类号： G01C21/20
- IPC分类号： G01C21/20 ; H04W4/02
摘要：
A method of calculating an accuracy of measuring a location, and a method and apparatus to measure a location of a terminal using the accuracy of measuring the location, are provided. The method of calculating the accuracy of measuring the location of the terminal includes providing a map corresponding to a location measurement type that is used in the terminal. The method further includes reading, from the map, map information of a predetermined area including the location of the terminal. The method further includes calculating the accuracy of measuring the location with the location measurement type based on the map information.
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