发明授权
US09026398B2 Motion analysis device and motion analysis method for analyzing deformation of measurement object
有权
运动分析装置和运动分析方法,用于分析测量对象的变形
- 专利标题: Motion analysis device and motion analysis method for analyzing deformation of measurement object
- 专利标题(中): 运动分析装置和运动分析方法,用于分析测量对象的变形
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申请号: US13347015申请日: 2012-01-10
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公开(公告)号: US09026398B2公开(公告)日: 2015-05-05
- 发明人: Toshiyasu Takasugi , Masatoshi Sato , Kazuo Nomura
- 申请人: Toshiyasu Takasugi , Masatoshi Sato , Kazuo Nomura
- 申请人地址: JP
- 专利权人: Seiko Epson Corporation
- 当前专利权人: Seiko Epson Corporation
- 当前专利权人地址: JP
- 代理机构: Harness, Dickey & Pierce, P.L.C.
- 优先权: JP2011-003012 20110111
- 主分类号: G06F15/00
- IPC分类号: G06F15/00 ; A63B24/00 ; A63B69/36
摘要:
A motion analysis device includes two posture angle sensors attached to a measurement object at locations distant from each other, a data acquisition section, a posture angle correction section, and a deformation amount calculation section. The data acquisition section acquires data of a first posture angle and a second posture angle respectively detected by the posture angle sensors. The posture angle correction section corrects a difference between the first posture angle and the second posture angle after starting a motion of the measurement object in accordance with a difference between the first posture angle and the second posture angle before starting the motion of the measurement object. The deformation amount calculation section calculates a deformation amount of the measurement object based on a difference between the first posture angle and the second posture angle corrected by the posture angle correction section.
公开/授权文献
- US20120179418A1 MOTION ANALYSIS DEVICE AND MOTION ANALYSIS METHOD 公开/授权日:2012-07-12
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