发明授权
- 专利标题: Substrate cleaning method and substrate cleaning device
- 专利标题(中): 基板清洗方法和基板清洗装置
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申请号: US13116793申请日: 2011-05-26
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公开(公告)号: US09028621B2公开(公告)日: 2015-05-12
- 发明人: Tadashi Miyagi , Masahiko Harumoto , Sadayasu Suyama
- 申请人: Tadashi Miyagi , Masahiko Harumoto , Sadayasu Suyama
- 申请人地址: JP
- 专利权人: SCREEN Semiconductor Solutions Co., Ltd.
- 当前专利权人: SCREEN Semiconductor Solutions Co., Ltd.
- 当前专利权人地址: JP
- 代理机构: Ostrolenk Faber LLP
- 优先权: JP2010-154509 20100707
- 主分类号: H01L21/02
- IPC分类号: H01L21/02 ; H01L21/67
摘要:
A substrate rotates, and a liquid nozzle of a gas/liquid supply nozzle moves to a position above the center of the rotating substrate. In this state, a rinse liquid is discharged from the liquid nozzle onto the rotating substrate. The gas/liquid supply nozzle moves toward a position outside the substrate. A gas nozzle reaches the position above the center of the rotating substrate, so that the gas/liquid supply nozzle temporarily stops. With the gas/liquid supply nozzle stopping, an inert gas is discharged onto the center of the rotating substrate for a given period of time. After that, the gas/liquid supply nozzle again moves toward the position outside the substrate.
公开/授权文献
- US20120006361A1 SUBSTRATE CLEANING METHOD AND SUBSTRATE CLEANING DEVICE 公开/授权日:2012-01-12
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