Invention Grant
- Patent Title: Memory device and method for verifying the same
- Patent Title (中): 用于验证其的存储器件和方法
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Application No.: US13602952Application Date: 2012-09-04
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Publication No.: US09036424B2Publication Date: 2015-05-19
- Inventor: Hyung-Min Lee
- Applicant: Hyung-Min Lee
- Applicant Address: KR Gyeonggi-do
- Assignee: SK Hynix Inc.
- Current Assignee: SK Hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2012-0056172 20120525
- Main IPC: G11C11/34
- IPC: G11C11/34 ; G11C16/34 ; G11C16/06 ; G11C16/24 ; G11C16/26

Abstract:
A memory includes a cell string including a plurality of memory cells connected in series, a bit line connected to the cell string, a voltage transfer unit configured to electrically connect the bit line and a sensing node in response to a control signal, and a page buffer configured to sense a voltage of the bit line through the sensing node in a sensing period, wherein the page buffer decides a voltage level of the control signal based on a threshold voltage of the target memory cell, which corresponds to a verification target among the plurality of memory cells in the sensing period.
Public/Granted literature
- US20130315003A1 MEMORY DEVICE AND METHOD FOR VERIFYING THE SAME Public/Granted day:2013-11-28
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