发明授权
- 专利标题: Semiconductor structure and manufacturing method thereof
- 专利标题(中): 半导体结构及其制造方法
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申请号: US14033524申请日: 2013-09-23
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公开(公告)号: US09041163B2公开(公告)日: 2015-05-26
- 发明人: Shang-Chun Chen , Cha-Hsin Lin , Yu-Chen Hsin
- 申请人: Industrial Technology Research Institute
- 申请人地址: TW Hsinchu
- 专利权人: Industrial Technology Research Institute
- 当前专利权人: Industrial Technology Research Institute
- 当前专利权人地址: TW Hsinchu
- 代理机构: Jianq Chyun IP Office
- 优先权: TW102113615A 20130417
- 主分类号: H01L21/768
- IPC分类号: H01L21/768 ; H01L23/48
摘要:
A semiconductor structure and a manufacturing method thereof are provided. The semiconductor structure includes a substrate, a device layer and a least one conductive post. The substrate includes a first surface, a second surface opposite to the first surface, and at least one through hole penetrating the substrate. The substrate includes a first side wall portion and a second side wall portion at the through hole. The first side wall portion is connected to the first surface and includes a plurality of first scallops. The second side wall portion is connected to the second surface and includes a non-scalloped surface. The device layer is disposed on the second surface, and the second side wall portion of the substrate further extends into the device layer along the non-scalloped surface. The conductive post is disposed in the through hole, wherein the conductive post is electrically connected to the device layer.
公开/授权文献
- US20140312468A1 SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF 公开/授权日:2014-10-23
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