A system for measuring properties of a surface under test with surface waves includes a surface wave network including a dielectric substrate, a reactive grid of a plurality of metallic patches on a first surface of the dielectric substrate, a plurality of electronic nodes on the first surface of the dielectric substrate, and a ground plane on a second surface of the dielectric substrate permeable to RF fields of the surface waves, and a controller configured for causing a respective one of the electronic nodes to transmit at least one surface wave and configured for collecting data for signals received by at least one other of the plurality of electronic nodes.