Invention Grant
- Patent Title: Flexible ADC calibration technique using ADC capture memory
- Patent Title (中): 灵活的ADC校准技术,采用ADC采集存储器
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Application No.: US14020529Application Date: 2013-09-06
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Publication No.: US09041571B2Publication Date: 2015-05-26
- Inventor: John Wang , Vasudevan Parthasarathy
- Applicant: Broadcom Corporation
- Applicant Address: US CA Irvine
- Assignee: Broadcom Corporation
- Current Assignee: Broadcom Corporation
- Current Assignee Address: US CA Irvine
- Agency: Sterne, Kessler, Goldstein & Fox PLLC
- Main IPC: H03M1/10
- IPC: H03M1/10 ; H03M1/12

Abstract:
Systems and methods are provided for calibrating an analog to digital converter (ADC) using one or more feedback mechanisms. In an embodiment, a capture memory module captures a portion of ADC data and post-processes the captured data using a microprocessor to perform calibration. Using the microprocessor, the capture memory module calibrates the ADC until the output of the ADC is within a desired range. In an embodiment, the capture memory module also captures a portion of data output from a digital correction module and post-processes this captured data using the microprocessor. Using the microprocessor, the capture memory module calibrates the digital correction module until the output of the digital correction module is within a desired range.
Public/Granted literature
- US20150070198A1 Flexible ADC Calibration Technique Using ADC Capture Memory Public/Granted day:2015-03-12
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