发明授权
US09042194B2 Refresh method, refresh address generator, volatile memory device including the same
有权
刷新方法,刷新地址生成器,易失性存储器包括相同的
- 专利标题: Refresh method, refresh address generator, volatile memory device including the same
- 专利标题(中): 刷新方法,刷新地址生成器,易失性存储器包括相同的
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申请号: US14057556申请日: 2013-10-18
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公开(公告)号: US09042194B2公开(公告)日: 2015-05-26
- 发明人: Chul-Woo Park , Joo-Sun Choi , Hong-Sun Hwang
- 申请人: Samsung Electronics Co., Ltd.
- 申请人地址: KR Yeongtong-gu, Suwon-si, Gyeonggi-do
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址: KR Yeongtong-gu, Suwon-si, Gyeonggi-do
- 代理机构: Muir Patent Law, PLLC
- 优先权: KR10-2012-0116356 20121019
- 主分类号: G11C11/402
- IPC分类号: G11C11/402 ; G11C11/406 ; G11C11/408 ; G11C8/08 ; G11C29/02
摘要:
A refresh method for a volatile memory device includes refreshing memory cells of a first set of rows of an array at a first refresh rate having a first refresh period, the first refresh rate being a lower rate having a longer refresh period than a second refresh rate having a second refresh period, wherein each memory cell in the first set of rows of the array has a retention time longer than the first refresh period; and refreshing memory cells of a second set of rows of the array at a third refresh rate having a third refresh period, the third refresh rate being a higher rate having a shorter refresh period than the second refresh rate having the second refresh period, wherein at least one memory cell of each row of the second set of rows has a retention time longer than the third refresh period and shorter than the first refresh period. The second refresh period corresponds to a refresh period defined in a standard for the volatile memory device.
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