Invention Grant
- Patent Title: Data recovery circuit and operation method thereof
- Patent Title (中): 数据恢复电路及其操作方法
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Application No.: US13718403Application Date: 2012-12-18
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Publication No.: US09042503B2Publication Date: 2015-05-26
- Inventor: Jong Shin Shin
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Onello & Mello, LLP.
- Priority: KR10-2012-0033742 20120402
- Main IPC: H04L7/00
- IPC: H04L7/00 ; H04L7/04

Abstract:
In a data recovery circuit, a sampling circuit is configured to sample data using a plurality of sampling clock signals having different phases relative to one another and to output a plurality of sampled data. A recovery data generation circuit is configured to perform a logic operation on the plurality of sampled data and to generate a plurality of intermediate recovery data according to a result of the logic operation. A recovery circuit is configured to check the plurality of intermediate recovery data for existence of an error and to output intermediate recovery data that is error-free, among the plurality of intermediate recovery data, as recovery data.
Public/Granted literature
- US20130259177A1 DATA RECOVERY CIRCUIT AND OPERATION METHOD THEREOF Public/Granted day:2013-10-03
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