Invention Grant
- Patent Title: Indentation tester
- Patent Title (中): 压痕测试仪
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Application No.: US13893481Application Date: 2013-05-14
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Publication No.: US09046456B2Publication Date: 2015-06-02
- Inventor: Eiji Furuta , Takeshi Sawa
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2012-123893 20120531
- Main IPC: G01N3/44
- IPC: G01N3/44 ; G01N3/42

Abstract:
Indentation tester capable of adjusting vertical-direction positioning drift due to individual differences of an indenter when indenters are switched includes an adjustment mechanism. The adjustment mechanism adjusts relative vertical-direction positions of a displacement sensor movable portion and a displacement sensor fixed portion. The adjustment mechanism includes a first hollow disk having a spiraling surface formed on a bottom surface; and a second hollow disk having a spiraling surface formed on a top surface. The spiraling surface of the second hollow disk has a thread equal to that of the spiraling surface of the first hollow disk. The first hollow disk rests on the second hollow disk such that the bottom surface of the first hollow disk is overlaid on the top surface of the second hollow disk. The first hollow disk and the second hollow disk are capable of rotation on a center axis of an indenter column.
Public/Granted literature
- US20130319091A1 INDENTATION TESTER Public/Granted day:2013-12-05
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