发明授权
- 专利标题: Microlithographic projection exposure apparatus
- 专利标题(中): 微光刻投影曝光装置
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申请号: US13007039申请日: 2011-01-14
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公开(公告)号: US09046787B2公开(公告)日: 2015-06-02
- 发明人: Toralf Gruner , Alexander Epple , Markus Degünther
- 申请人: Toralf Gruner , Alexander Epple , Markus Degünther
- 申请人地址: DE Oberkochen
- 专利权人: Carl Zeiss SMT GmbH
- 当前专利权人: Carl Zeiss SMT GmbH
- 当前专利权人地址: DE Oberkochen
- 代理机构: Fish & Richardson P.C.
- 主分类号: G03B27/42
- IPC分类号: G03B27/42 ; G03F7/20
摘要:
A projection exposure apparatus has a projection lens with an object plane, an image plane, an optical axis and a non-telecentric entrance pupil. The apparatus further comprises an illumination system having an intermediate field plane and a field stop. The field stop is positioned in or in close proximity to the intermediate field plane and defines an illuminated field in the object plane that does not contain the optical axis of the projection lens. The illumination system is configured such that, in the object plane, a mean of the angles formed between all principal rays emanating from the intermediate field plane on the one hand and the optical axis of the projection lens on the other hand differs from 0°.
公开/授权文献
- US20110109893A1 MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS 公开/授权日:2011-05-12
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