Invention Grant
- Patent Title: Power supply device and method of determining abnormality in power supply device
- Patent Title (中): 电源装置及电源装置异常判定方法
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Application No.: US13853574Application Date: 2013-03-29
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Publication No.: US09048735B2Publication Date: 2015-06-02
- Inventor: Nobuhiro Kihara , Hiroshi Okuda
- Applicant: Nobuhiro Kihara , Hiroshi Okuda
- Applicant Address: JP Tokyo
- Assignee: Mitsubishi Electric Corporation
- Current Assignee: Mitsubishi Electric Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Agent Richard C. Turner
- Priority: JP2012-219125 20121001
- Main IPC: G05F1/00
- IPC: G05F1/00 ; H02M1/32 ; H02M3/157 ; H02M3/158

Abstract:
A power supply device includes: a first switching element and a flywheel semiconductor element which are connected in series to a first DC power source in this order; and a reactor and a second DC power source which are connected in series in this order to a node between the first switching element and the flywheel semiconductor element. A second switching element and a charge circuit for charging a line between the first switching element and the second switching element are interposed between the reactor and the second DC power source. Abnormality of each element is determined from a voltage of each portion of the power supply device measured when the first and second switching elements and the flywheel semiconductor element are driven and controlled.
Public/Granted literature
- US20140092652A1 POWER SUPPLY DEVICE AND METHOD OF DETERMINING ABNORMALITY IN POWER SUPPLY DEVICE Public/Granted day:2014-04-03
Information query
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