Invention Grant
- Patent Title: Fuse circuit and testing method of the same
- Patent Title (中): 保险丝电路及其测试方法相同
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Application No.: US13595259Application Date: 2012-08-27
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Publication No.: US09052352B2Publication Date: 2015-06-09
- Inventor: Kwi-Dong Kim
- Applicant: Kwi-Dong Kim
- Applicant Address: KR Gyeonggi-do
- Assignee: SK Hynix Inc.
- Current Assignee: SK Hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2011-0139635 20111221
- Main IPC: G11C17/18
- IPC: G11C17/18 ; G01R31/07

Abstract:
A fuse circuit includes a data line, a plurality of fuse cells selectively programmed and electrically connected with the data line in response to respective selection signals, a dummy fuse cell electrically connected with the data line in response to a test signal, and a sense amplifier configured to sense a data of the data line. The fuse circuit includes a plurality of fuses, reduces the area thereof, and easily detects whether a sense amplifier operates properly or not in the fuse circuit.
Public/Granted literature
- US20130162263A1 FUSE CIRCUIT AND TESTING METHOD OF THE SAME Public/Granted day:2013-06-27
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