发明授权
- 专利标题: Multi-die package with separate inter-die interconnects
- 专利标题(中): 具有独立芯片间互连的多芯片封装
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申请号: US13778801申请日: 2013-02-27
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公开(公告)号: US09054040B2公开(公告)日: 2015-06-09
- 发明人: Khalil Hosseini , Joachim Mahler , Josef Höglauer
- 申请人: Infineon Technologies Austria AG
- 申请人地址: AT Villach
- 专利权人: Infineon Technologies Austria AG
- 当前专利权人: Infineon Technologies Austria AG
- 当前专利权人地址: AT Villach
- 代理机构: Murphy, Bilak & Homiller, PLLC
- 主分类号: H05K7/02
- IPC分类号: H05K7/02 ; H05K7/06 ; H05K7/08 ; H05K7/10 ; H01L23/00
摘要:
A first electrode at a first side of a first semiconductor die is connected to a first conductive region of a substrate. A first electrode at a first side of a second semiconductor die is connected to a second conductive region of the substrate. Each die has a second electrode at an opposing second side of the respective die. A first metal layer extends from a periphery region of the substrate to over the first die. The first metal layer has a generally rectangular cross-sectional area and connects one of the conductive regions in the periphery region of the substrate to the second electrode of the first die. A second metal layer separate from the first metal layer extends over the first and second dies. The second metal layer has a generally rectangular cross-sectional area and connects the second electrodes of the first and second dies.
公开/授权文献
- US20140240945A1 Multi-Die Package with Separate Inter-Die Interconnects 公开/授权日:2014-08-28
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