Invention Grant
- Patent Title: Optical electrical field enhancing device and measuring apparatus equipped with the device
- Patent Title (中): 配备有该装置的光电场增强装置和测量装置
-
Application No.: US14033127Application Date: 2013-09-20
-
Publication No.: US09059568B2Publication Date: 2015-06-16
- Inventor: Shogo Yamazoe , Masayuki Naya , Shinya Hakuta
- Applicant: FUJIFILM Corporation
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP2011-062091 20110322
- Main IPC: G01N21/55
- IPC: G01N21/55 ; H01S3/30 ; B82Y20/00 ; G01N21/552 ; G01N21/64 ; G01N21/65
Abstract:
An optical electrical field enhancing device includes: a transparent substrate having a structure of fine protrusions and recesses on the surface thereof; and a metal structure layer of fine protrusions and recesses formed on the surface of the structure of fine protrusions and recesses. The metal structure layer of fine protrusions and recesses has a structure of fine protrusions and recesses, in which the distances among adjacent protrusions are less than the distances among corresponding adjacent protrusions of the structure of fine protrusions and recesses of the transparent substrate.
Public/Granted literature
- US20140016127A1 OPTICAL ELECTRICAL FIELD ENHANCING DEVICE AND MEASURING APPARATUS EQUIPPED WITH THE DEVICE Public/Granted day:2014-01-16
Information query
