Invention Grant
- Patent Title: Enable/disable of memory chunks during memory access
- Patent Title (中): 在内存访问期间启用/禁用内存块
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Application No.: US13718801Application Date: 2012-12-18
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Publication No.: US09064578B2Publication Date: 2015-06-23
- Inventor: Toru Tanzawa , Satoru Tamada , Koichi Kawai , Tetsuji Manabe
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: G11C16/08
- IPC: G11C16/08 ; G11C16/04 ; G11C16/06 ; G11C7/18
Abstract:
Chunks of memory cells in a memory array are enabled to be accessed and then one or more of the chunks are disabled from being accessed. In one such apparatus, an array includes chunks of memory cells and a chunk selector circuit coupled to each chunk to enable the memory cells in the respective chunk to be accessed.
Public/Granted literature
- US20140169098A1 APPARATUSES AND METHODS INVOLVING ACCESSING MEMORY CELLS Public/Granted day:2014-06-19
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