发明授权
- 专利标题： Analyzer and method for sensing using the same
- 专利标题（中）： 分析仪和使用它的感测方法
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申请号： US13254883申请日： 2009-03-07
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公开(公告)号： US09068921B2公开(公告)日： 2015-06-30
- 发明人: Wei Wu , Qiangfei Xia , Shih-Yuan Wang , Jingjing Li
- 申请人： Wei Wu , Qiangfei Xia , Shih-Yuan Wang , Jingjing Li
- 申请人地址： US TX Houston
- 专利权人： Hewlett-Packard Development Company, L.P.
- 当前专利权人： Hewlett-Packard Development Company, L.P.
- 当前专利权人地址： US TX Houston
- 代理机构： Dierker & Associates, P.C.
- 国际申请： PCT/US2009/036440 WO 20090307
- 国际公布： WO2010/104497 WO 20100916
- 主分类号： G01N21/01
- IPC分类号： G01N21/01 ; G01N21/05 ; B01L3/00 ; G01N21/03 ; G01N21/31 ; G01N21/64
摘要：
An analyzer is disclosed herein. The analyzer encompasses a substrate having a surface with a plurality of distinct V-grooves formed therein. An input flow channel is configured to intersect and fluidly communicate with each of the plurality of distinct V-grooves at respective input points, and an output flow channel is configured to intersect and fluidly communicate with each of the plurality of distinct V-grooves at respective output points.
公开/授权文献
- US20110315902A1 ANALYZER AND METHOD FOR SENSING USING THE SAME 公开/授权日：2011-12-29