发明授权
- 专利标题: Testing method using guided wave
- 专利标题(中): 使用导波的测试方法
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申请号: US13574187申请日: 2010-02-12
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公开(公告)号: US09068938B2公开(公告)日: 2015-06-30
- 发明人: Koki Daikoku , Masato Yoshizaki , Shuichi Sato
- 申请人: Koki Daikoku , Masato Yoshizaki , Shuichi Sato
- 申请人地址: JP Tokyo
- 专利权人: IHI Inspection and Instrumentation Co., Ltd.
- 当前专利权人: IHI Inspection and Instrumentation Co., Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: Griffin & Szipl, P.C.
- 优先权: JP2010-012278 20100122
- 国际申请: PCT/JP2010/052070 WO 20100212
- 国际公布: WO2011/089734 WO 20110728
- 主分类号: G01N9/24
- IPC分类号: G01N9/24 ; G01N29/44 ; G01N29/11 ; G01N29/24
摘要:
(A) first data for defect amount estimation for the guided wave of a first frequency is obtained, the data indicating a relationship among amplitude of the reflected wave, a defect cross-sectional area and a defect width. (B) second data for defect amount estimation for the guided wave of a second frequency is obtained, the data indicating a relationship among amplitude of the reflected wave, a defect cross-sectional area and a defect width. (C) a guided wave of the first frequency is generated, and amplitude of a reflected wave is detected as first amplitude. (D) a guided wave of the second frequency is generated, and amplitude of a reflected wave is detected as second amplitude. (E) on a basis of the first and second data and the first and second amplitude, a defect cross-sectional area and a defect width of the defect part are estimated.
公开/授权文献
- US20120291552A1 TESTING METHOD USING GUIDED WAVE 公开/授权日:2012-11-22