Methods and apparatuses are disclosed that allow measurement of a user's interaction with the housing of an electronic device. Some embodiments may measure the electrical characteristics of a housing of an electrical device, where the housing is capable of being temporarily deformed by the user's interaction. By measuring the electrical characteristics of the housing, such as the housing's capacitance, the user's interaction with the housing can be measured in a manner that is independent of the user's electrical characteristics and/or in a manner that may allow the pressure applied to the housing to be quantified.