发明授权
- 专利标题: Resistance change memory
- 专利标题(中): 电阻变化记忆
-
申请号: US14201664申请日: 2014-03-07
-
公开(公告)号: US09070440B2公开(公告)日: 2015-06-30
- 发明人: Masahiro Takahashi
- 申请人: Masahiro Takahashi
- 代理机构: Holtz, Holtz, Goodman & Chick PC
- 主分类号: G11C7/22
- IPC分类号: G11C7/22 ; G11C7/06 ; G11C7/08 ; G11C5/06 ; G11C7/00 ; G11C29/00 ; G11C7/14 ; G11C13/00 ; G11C5/14 ; G11C29/02 ; G11C16/28 ; G11C11/56
摘要:
According to one embodiment, a resistance change memory includes a first memory cell, a word line, a first bit line, first and second inverters, first to sixth MOS transistors, and a control circuit. The first transistor is connected to the first output terminal of the first inverter. The second transistor is connected to the second output terminal of the second inverter. The fifth transistor has a first current path whose one end is connected to the first voltage terminal of the first inverter. The sixth transistor has a second current path whose one end is connected to the third voltage terminal of the second inverter. The control circuit makes the first and second transistors a cutoff state by a first signal and makes the fifth and sixth transistors the cutoff state by a second signal in a standby state.
公开/授权文献
- US20150055396A1 RESISTANCE CHANGE MEMORY 公开/授权日:2015-02-26
信息查询