发明授权
- 专利标题: Resistance memory cell and operation method thereof
- 专利标题(中): 电阻记忆单元及其操作方法
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申请号: US13601209申请日: 2012-08-31
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公开(公告)号: US09070860B2公开(公告)日: 2015-06-30
- 发明人: Wei-Chih Chien , Ming-Hsiu Lee
- 申请人: Wei-Chih Chien , Ming-Hsiu Lee
- 申请人地址: TW Hsinchu
- 专利权人: MACRONIX International Co. Ltd.
- 当前专利权人: MACRONIX International Co. Ltd.
- 当前专利权人地址: TW Hsinchu
- 代理机构: J.C. Patents
- 主分类号: H01L45/00
- IPC分类号: H01L45/00 ; G11C13/00 ; G11C29/50
摘要:
A resistance memory cell is provided and includes a first electrode, a tungsten metal layer, a metal oxide layer, and a second electrode. The tungsten metal layer is disposed on the first electrode. The metal oxide layer is disposed on the tungsten metal layer. The second electrode includes a first connection pad, a second connection pad, and a bridge portion electrically connected between the first connection pad and the second connection pad. The bridge portion is disposed on the metal oxide layer or surrounds the metal oxide layer. The resistance memory cell adjusts a resistivity of the metal oxide layer through a first current path, passing through the metal oxide layer and the tungsten metal layer, or a second current path extending from the first connection pad to the second connection pad.
公开/授权文献
- US20130343115A1 RESISTANCE MEMORY CELL AND OPERATION METHOD THEREOF 公开/授权日:2013-12-26
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