发明授权
- 专利标题: Method for evaluating the accuracy and repeatability of leak testing instruments
- 专利标题(中): 泄漏检测仪器的精度和重复性的评估方法
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申请号: US13593773申请日: 2012-08-24
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公开(公告)号: US09074959B2公开(公告)日: 2015-07-07
- 发明人: Ranajit Ghosh , Sunil Nandwani , John S. Agapiou , Paul W. Tanis
- 申请人: Ranajit Ghosh , Sunil Nandwani , John S. Agapiou , Paul W. Tanis
- 申请人地址: US MI Detroit
- 专利权人: GM Global Technology Operations, LLC
- 当前专利权人: GM Global Technology Operations, LLC
- 当前专利权人地址: US MI Detroit
- 主分类号: G01M3/00
- IPC分类号: G01M3/00
摘要:
A method of determining the accuracy and repeatability of leak testing instrumentation comprises the following steps: providing a two chamber vessel having an access port and a flow controlling reference orifice associated with each chamber and a third reference orifice communicating between the two chambers, providing a leak testing device and connecting such leak testing device first to one of such ports, pressurizing the associated chamber and, with the associated orifice open, observing and recording the pressure measured by the leak testing device under test as a function of time. The second test repeats this activity with the other chamber and the other orifice. A third test is undertaken with the third orifice open. One of the chambers is smaller and incorporates a smaller orifice and the other chamber is larger and incorporates a larger orifice thus achieving leak testing under different conditions.
公开/授权文献
- US20140053636A1 EVALUATION OF LEAK TESTING INSTRUMENTS 公开/授权日:2014-02-27
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