发明授权
- 专利标题: Semiconductor device and method of fabricating the same
- 专利标题(中): 半导体装置及其制造方法
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申请号: US14166722申请日: 2014-01-28
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公开(公告)号: US09076772B2公开(公告)日: 2015-07-07
- 发明人: Jong Ho Lee , Kyung Do Kim
- 申请人: SK hynix Inc. , SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION
- 申请人地址: KR Icheon KR Seoul
- 专利权人: SK HYNIX INC.,SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION
- 当前专利权人: SK HYNIX INC.,SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION
- 当前专利权人地址: KR Icheon KR Seoul
- 优先权: KR10-2013-0009518 20130128
- 主分类号: H01L23/535
- IPC分类号: H01L23/535 ; H01L23/48
摘要:
A semiconductor device and a method of fabricating the same. The semiconductor device includes a semiconductor substrate having a P-type region, on at least one main surface of which integrated circuits are formed; one or more via electrodes inserted into the P-type region of the semiconductor substrate; a dielectric layer formed between the semiconductor substrate and the via electrodes; an N-type region, which is formed in the semiconductor substrate to contact a portion of the dielectric layer and to expose other portion of the dielectric layer; and a power circuit, which is electrically connected to the N-type region and apply a bias voltage or a ground voltage thereto, such that electric signals flowing in the via electrodes form an inversion layer on a surface of the semiconductor substrate facing the exposed portion of the dielectric layer.
公开/授权文献
- US20140210058A1 SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME 公开/授权日:2014-07-31
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