Invention Grant
- Patent Title: Diagnostics in a distributed fabric system
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Application No.: US13414684Application Date: 2012-03-07
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Publication No.: US09077624B2Publication Date: 2015-07-07
- Inventor: Sushma Anantharam , Nirapada Ghosh , Keshav Govind Kamble , Dar-Ren Leu , Chandarani J. Mendon , Nilanjan Mukherjee , Vijoy Pandey , Nandakumar Peethambaram
- Applicant: Sushma Anantharam , Nirapada Ghosh , Keshav Govind Kamble , Dar-Ren Leu , Chandarani J. Mendon , Nilanjan Mukherjee , Vijoy Pandey , Nandakumar Peethambaram
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Schmeiser, Olsen & Watts LLP
- Agent Michael A. Rodriguez
- Main IPC: H04L12/28
- IPC: H04L12/28 ; G06F15/173 ; G06F13/00 ; H04L12/26 ; H04L12/24 ; H04L12/939

Abstract:
A distributed fabric system has distributed line card (DLC) chassis and scaled-out fabric coupler (SFC) chassis. Each DLC chassis includes a network processor and fabric ports. Each network processor of each DLC chassis includes a fabric interface in communication with the DLC fabric ports of that DLC chassis. Each SFC chassis includes a fabric element and fabric ports. A communication link connects each SFC fabric port to one DLC fabric port. Each communication link includes cell-carrying lanes. Each fabric element of each SFC chassis collects per-lane statistics for each SFC fabric port of that SFC chassis. Each SFC chassis includes program code that obtains the per-lane statistics collected by the fabric element chip of that SFC chassis. A network element includes program code that gathers the per-lane statistics collected by each fabric element of each SFC chassis and integrates the statistics into a topology of the entire distributed fabric system.
Public/Granted literature
- US20130235735A1 DIAGNOSTICS IN A DISTRIBUTED FABRIC SYSTEM Public/Granted day:2013-09-12
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