发明授权
- 专利标题: Automatic analyzer
- 专利标题(中): 自动分析仪
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申请号: US13979668申请日: 2012-01-10
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公开(公告)号: US09080972B2公开(公告)日: 2015-07-14
- 发明人: Akihisa Makino , Sakuichiro Adachi
- 申请人: Akihisa Makino , Sakuichiro Adachi
- 申请人地址: JP Tokyo
- 专利权人: HITACHI HIGH-TECHNOLOGIES CORPORATION
- 当前专利权人: HITACHI HIGH-TECHNOLOGIES CORPORATION
- 当前专利权人地址: JP Tokyo
- 代理机构: Mattingly & Malur, PC
- 优先权: JP2011-006809 20110117
- 国际申请: PCT/JP2012/050243 WO 20120110
- 国际公布: WO2012/098946 WO 20120726
- 主分类号: G01N21/53
- IPC分类号: G01N21/53 ; G01N21/49 ; G01N21/51 ; G01N35/00
摘要:
The scattered light from the measurement target substance passes through a light receiving window, and is received by a detector for +θ scattered light and a detector for −θ scattered light which are arranged symmetrically to each other across an optical axis at an equal angle or an equal interval in a vertical direction. A light source is fixed by a light-source holder (that is a base member on which the light source is arranged), and the detectors are arranged on and fixed to a detector holder (that is a base member on which the detectors are arranged). In this manner, drift of the light quantity data caused by the thermal deformation of the optical system can be corrected by comparing values of the light quantity data of the detectors.
公开/授权文献
- US20130301048A1 AUTOMATIC ANALYZER 公开/授权日:2013-11-14
信息查询
IPC分类: