Invention Grant
US09082506B2 Synchronous semiconductor memory device having delay locked loop circuit and method of controlling the delay locked loop circuit
有权
具有延迟锁定环电路的同步半导体存储器件和控制延迟锁定环电路的方法
- Patent Title: Synchronous semiconductor memory device having delay locked loop circuit and method of controlling the delay locked loop circuit
- Patent Title (中): 具有延迟锁定环电路的同步半导体存储器件和控制延迟锁定环电路的方法
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Application No.: US14204444Application Date: 2014-03-11
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Publication No.: US09082506B2Publication Date: 2015-07-14
- Inventor: Tae-Sik Na
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Samsung-ro, Yeongtong-gu, Suwon si, Gyeonggi-do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Samsung-ro, Yeongtong-gu, Suwon si, Gyeonggi-do
- Agency: Muir Patent Law, PLLC
- Priority: KR10-2013-0026876 20130313
- Main IPC: G11C7/00
- IPC: G11C7/00 ; G11C5/14 ; G11C8/00 ; G11C8/16 ; G11C11/4076 ; G11C5/04 ; G11C7/22 ; G11C11/4074 ; G11C8/18

Abstract:
An operating method of a delay locked loop (DLL) circuit for a semiconductor memory device is disclosed. The DLL circuit may include a plurality of sub-circuits. The method may include calculating an additive latency value based on predetermined parameters, and controlling a set of the plurality of sub-circuits of the DLL circuit to be maintained in a turn-off state based on the calculated additive latency value, during a period of time after the semiconductor device receives an operation command in a power saving mode.
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