发明授权
- 专利标题: Determining similarity scores of anomalies
- 专利标题(中): 确定异常的相似度分数
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申请号: US13700620申请日: 2010-06-09
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公开(公告)号: US09087089B2公开(公告)日: 2015-07-21
- 发明人: Ruth Bernstein , Ira Cohen , Chen Kahana
- 申请人: Ruth Bernstein , Ira Cohen , Chen Kahana
- 申请人地址: US TX Houston
- 专利权人: Hewlett-Packard Development Company, L.P.
- 当前专利权人: Hewlett-Packard Development Company, L.P.
- 当前专利权人地址: US TX Houston
- 代理机构: Conley, Rose P.C.
- 国际申请: PCT/US2010/038053 WO 20100609
- 国际公布: WO2011/155933 WO 20111215
- 主分类号: G06F17/30
- IPC分类号: G06F17/30 ; G06F9/44 ; G06F11/36
摘要:
A method and system comprise abstracting configuration items (CI) in at least a first anomaly and a second anomaly based on type of CI. Further, CIs are matched of a common type between the first and second anomalies based on a cost function. Additionally, a similarity score is computed for the first and second anomalies based, at least in part, on the cost function of the matched CI's and based on topology of the first and second anomalies.
公开/授权文献
- US20130080451A1 DETERMINING SIMILARITY SCORES OF ANOMALIES 公开/授权日:2013-03-28
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