发明授权
- 专利标题: Semiconductor device and method of embedding TSV semiconductor die within substrate for vertical interconnect in POP
- 专利标题(中): 半导体器件和嵌入TSV半导体管芯在基板内的垂直互连的方法
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申请号: US13098438申请日: 2011-04-30
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公开(公告)号: US09087701B2公开(公告)日: 2015-07-21
- 发明人: DongSam Park , YongDuk Lee
- 申请人: DongSam Park , YongDuk Lee
- 申请人地址: SG Singapore
- 专利权人: STATS ChipPAC, Ltd.
- 当前专利权人: STATS ChipPAC, Ltd.
- 当前专利权人地址: SG Singapore
- 代理机构: Patent Law Group: Atkins and Associates, P.C.
- 代理商 Robert D. Atkins
- 主分类号: H01L21/00
- IPC分类号: H01L21/00 ; H01L23/00 ; H01L25/10 ; H01L25/065 ; H01L23/48
摘要:
A semiconductor device has a substrate with a first conductive layer over a surface of the substrate and a plurality of cavities exposing the first conductive layer. A first semiconductor die having conductive TSV is mounted into the cavities of the substrate. A first insulating layer is formed over the substrate and first semiconductor die and extends into the cavities to embed the first semiconductor die within the substrate. A portion of the first insulating layer is removed to expose the conductive TSV. A second conductive layer is formed over the conductive TSV. A portion of the first conductive layer is removed to form electrically common or electrically isolated conductive segments of the first conductive layer. A second insulating layer is formed over the substrate and conductive segments of the first conductive layer. A second semiconductor die is mounted over the substrate electrically connected to the second conductive layer.
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