发明授权
- 专利标题： Semiconductor device and variation information obtaining program
- 专利标题（中）： 半导体器件和变异信息获取程序
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申请号： US13783329申请日： 2013-03-03
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公开(公告)号： US09094021B2公开(公告)日： 2015-07-28
- 发明人: Chihiro Arai , Toshiya Uozumi , Keisuke Ueda
- 申请人： Renesas Electronics Corporation
- 申请人地址： JP Kawasaki-shi
- 专利权人： Renesas Electronics Corporation
- 当前专利权人： Renesas Electronics Corporation
- 当前专利权人地址： JP Kawasaki-shi
- 代理机构： Miles & Stockbridge P.C.
- 优先权： JP2012-082768 20120330
- 主分类号： H03L7/08
- IPC分类号： H03L7/08 ; H03L1/00 ; H03B5/04 ; H03B5/12 ; H03L7/06 ; H03L7/099
摘要：
A conventional semiconductor device has a problem that acquisition of variation information of circuit elements constructing the semiconductor device is not easy. According to an embodiment, a semiconductor device has a control circuit which makes an oscillation circuit operate by at least two operation current values, obtains first frequency information related to frequency of an output signal corresponding to a first operation current value and second frequency information related to frequency of an output signal corresponding to a second operation current value, and obtains manufacture variation information of a circuit element on the basis of the difference between the first and second frequency information.
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