发明授权
- 专利标题: Tilt minimization through intensity control of light source
- 专利标题(中): 通过光源的强度控制来倾斜最小化
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申请号: US13956222申请日: 2013-07-31
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公开(公告)号: US09097517B2公开(公告)日: 2015-08-04
- 发明人: Colin Farrell
- 申请人: Colin Farrell
- 申请人地址: US CA Santa Barbara
- 专利权人: BRUKER NANO INC.
- 当前专利权人: BRUKER NANO INC.
- 当前专利权人地址: US CA Santa Barbara
- 代理商 Antonio R. Durando
- 主分类号: G03B13/36
- IPC分类号: G03B13/36 ; G01B11/26 ; G02B7/38 ; G02B21/24
摘要:
The power input to the light source of a microscope is varied as necessary to maintain a constant degree of detector saturation as the objective is moved toward a best-focus position. Focus is found by tracking the source's intensity necessary to maintain the detector irradiance at a constant level. The in-focus position is reached when the power input (and correspondingly the intensity of the light emitted by the source) reaches a minimum. The concept can be applied in a similar manner to minimize or eliminate tilt in a sample.
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