Invention Grant
- Patent Title: High throughput quantum efficiency combinatorial characterization tool and method for combinatorial solar test substrates
- Patent Title (中): 用于组合太阳能测试基板的高通量量子效率组合表征工具和方法
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Application No.: US14077545Application Date: 2013-11-12
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Publication No.: US09103871B2Publication Date: 2015-08-11
- Inventor: Yun Wang , Tony P. Chiang , Chi-I Lang
- Applicant: Intermolecular, Inc.
- Applicant Address: US CA San Jose
- Assignee: Intermolecular, Inc.
- Current Assignee: Intermolecular, Inc.
- Current Assignee Address: US CA San Jose
- Main IPC: G01R31/26
- IPC: G01R31/26 ; G01N21/55 ; H02S50/10

Abstract:
Simultaneous measurement of an internal quantum efficiency and an external quantum efficiency of a solar cell using an emitter that emits light; a three-way beam splitter that splits the light into solar cell light and reference light, wherein the solar cell light strikes the solar cell; a reference detector that detects the reference light; a reflectance detector that detects reflectance light, wherein the reflectance light comprises a portion of the solar cell light reflected off the solar cell; a source meter operatively coupled to the solar cell; a multiplexer operatively coupled to the solar cell, the reference detector, and the reflectance detector; and a computing device that simultaneously computes the internal quantum efficiency and the external quantum efficiency of the solar cell.
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