发明授权
- 专利标题: Optical imaging device and imaging method for microscopy
- 专利标题(中): 光学成像装置及显微镜成像方法
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申请号: US12568483申请日: 2009-09-28
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公开(公告)号: US09104026B2公开(公告)日: 2015-08-11
- 发明人: Alexander Epple , Ella Mizkewicz , Heiko Feldmann
- 申请人: Alexander Epple , Ella Mizkewicz , Heiko Feldmann
- 申请人地址: DE Oberkochen
- 专利权人: Carl Zeiss SMT GmbH
- 当前专利权人: Carl Zeiss SMT GmbH
- 当前专利权人地址: DE Oberkochen
- 代理机构: Fish & Richardson P.C.
- 优先权: DE102008049589 20080930
- 主分类号: G02B17/00
- IPC分类号: G02B17/00 ; G02B21/00 ; G02B23/00 ; G02B21/04 ; G02B17/06
摘要:
The present invention relates to an optical imaging device, in particular for microscopy, with a first optical element group and a second optical element group, wherein the first optical element group and the second optical element group, on an image plane, form an image of an object point of an object plane. The first optical element group includes a first optical element with a reflective first optical surface and a second optical element with a reflective second optical surface. The second optical element group includes a third optical element with a reflective third optical surface. The first optical element and the second optical element are formed and arranged such that on formation of the image of the object point, in each case a multiple reflection of at least one imaging beam takes place on the first optical surface and the second optical surface.
公开/授权文献
- US20100188738A1 Optical imaging device and imaging method for microscopy 公开/授权日:2010-07-29
信息查询
IPC分类:
G | 物理 |
G02 | 光学 |
G02B | 光学元件、系统或仪器 |
G02B17/00 | 有或无折射元件的具有反射面的系统 |