Invention Grant
US09105686B2 Fabrication of localized SOI on localized thick box using selective epitaxy on bulk semiconductor substrates for photonics device integration
有权
使用局部半导体衬底上的选择性外延在局部厚盒上制造局域化的SOI器件用于光子器件集成
- Patent Title: Fabrication of localized SOI on localized thick box using selective epitaxy on bulk semiconductor substrates for photonics device integration
- Patent Title (中): 使用局部半导体衬底上的选择性外延在局部厚盒上制造局域化的SOI器件用于光子器件集成
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Application No.: US13667384Application Date: 2012-11-02
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Publication No.: US09105686B2Publication Date: 2015-08-11
- Inventor: Solomon Assefa , William M. Green , Marwan H. Khater , Yurri A. Vlasov
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Scully, Scott, Murphy & Presser, P.C.
- Agent Vazken Alexanian
- Main IPC: H01L21/762
- IPC: H01L21/762

Abstract:
Photonic devices are created by laterally growing a semiconductor material (i.e., a localized semiconductor-on-insulator layer) over a localized buried oxide (BOX) created in a semiconductor by either a trench isolation process or thermal oxidation. In one embodiment, and after trench formation in a semiconductor substrate, the trench is filled with oxide to create a localized BOX. The top surface of the BOX is recessed to depth below the topmost surface of the semiconductor substrate to expose sidewall surfaces of the semiconductor substrate within each trench. A semiconductor material is then epitaxially grown from the exposed sidewall surfaces of the semiconductor substrate.
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