Systems, processes, and structures allow enhanced near-field testing of the uplink and/or downlink performance of MIMO wireless devices (DUT), such as for any of product development, product verification, and/or production testing. Signal channels may preferably be emulated to test the performance of a device under test (DUT) over a range of simulated distances, within a near-field test environment. An enhanced process provides automated testing of a DUT over a wireless network, e.g. such as but not limited to a WLAN. The enhanced MIMO channel emulator may preferably be operated over a high dynamic range.