发明授权
US09111605B2 Semiconductor storage apparatus or semiconductor memory module 有权
半导体存储装置或半导体存储器模块

  • 专利标题: Semiconductor storage apparatus or semiconductor memory module
  • 专利标题(中): 半导体存储装置或半导体存储器模块
  • 申请号: US14070131
    申请日: 2013-11-01
  • 公开(公告)号: US09111605B2
    公开(公告)日: 2015-08-18
  • 发明人: Satoru Hanzawa
  • 申请人: Hitachi, Ltd.
  • 申请人地址: JP Tokyo
  • 专利权人: Hitachi, Ltd.
  • 当前专利权人: Hitachi, Ltd.
  • 当前专利权人地址: JP Tokyo
  • 代理机构: Miles & Stockbridge P.C.
  • 优先权: JP2010-280871 20101216
  • 主分类号: G11C7/10
  • IPC分类号: G11C7/10 G11C7/22 G11C13/00
Semiconductor storage apparatus or semiconductor memory module
摘要:
A semiconductor storage apparatus provides a large capacity phase-change memory possessing high speed operation, low electrical current, and high-reliability. During the period that a read-out start signal is activated in the memory region control circuit and the block of pairs of sense-latch and write driver is performing the verify read in the upper section memory region; the write enable signals in the memory region control circuit are activated and the block of pairs of sense-latch and write driver perform rewrite operation of the data in the lower section memory region. This type of operation allows cancelling out the time required for the verify read and the time required for the time-division write operation by performing the verify read in one memory region, while performing time-division rewrite in other memory region, to achieve both higher reliability rewrite operation along with suppressing the rewrite operation peak electrical current.
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