Invention Grant
- Patent Title: Magnetic property analyzing apparatus and method
- Patent Title (中): 磁性分析仪和方法
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Application No.: US13648384Application Date: 2012-10-10
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Publication No.: US09117041B2Publication Date: 2015-08-25
- Inventor: Koichi Shimizu
- Applicant: FUJITSU LIMITED
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki
- Agency: Fujitsu Patent Center
- Priority: JP2011-280544 20111221
- Main IPC: G06F19/00
- IPC: G06F19/00 ; G06F17/50

Abstract:
A magnetic property analyzing apparatus includes a first computing unit to perform a magnetic field analysis utilizing a FEM using an average magnetization given with respect to each of elements to which an analyzing target is segmented, and a second computing unit that computes an effective magnetic field acting on each element using a magnetic field computed by the magnetic field analysis, computes magnetization vectors within each element by obtaining a time integral of a LLG equation using the effective magnetic field, and computes an average magnetization for each element by averaging the magnetization vectors.
Public/Granted literature
- US20130166229A1 MAGNETIC PROPERTY ANALYZING APPARATUS AND METHOD Public/Granted day:2013-06-27
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