发明授权
- 专利标题: Magnetic property analyzing apparatus and method
- 专利标题(中): 磁性分析仪和方法
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申请号: US13648384申请日: 2012-10-10
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公开(公告)号: US09117041B2公开(公告)日: 2015-08-25
- 发明人: Koichi Shimizu
- 申请人: FUJITSU LIMITED
- 申请人地址: JP Kawasaki
- 专利权人: FUJITSU LIMITED
- 当前专利权人: FUJITSU LIMITED
- 当前专利权人地址: JP Kawasaki
- 代理机构: Fujitsu Patent Center
- 优先权: JP2011-280544 20111221
- 主分类号: G06F19/00
- IPC分类号: G06F19/00 ; G06F17/50
摘要:
A magnetic property analyzing apparatus includes a first computing unit to perform a magnetic field analysis utilizing a FEM using an average magnetization given with respect to each of elements to which an analyzing target is segmented, and a second computing unit that computes an effective magnetic field acting on each element using a magnetic field computed by the magnetic field analysis, computes magnetization vectors within each element by obtaining a time integral of a LLG equation using the effective magnetic field, and computes an average magnetization for each element by averaging the magnetization vectors.
公开/授权文献
- US20130166229A1 MAGNETIC PROPERTY ANALYZING APPARATUS AND METHOD 公开/授权日:2013-06-27
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