Invention Grant
- Patent Title: Chip with through silicon via electrode and method of forming the same
- Patent Title (中): 通过硅芯片通过电极及其形成方法
-
Application No.: US13747492Application Date: 2013-01-23
-
Publication No.: US09123789B2Publication Date: 2015-09-01
- Inventor: Ming-Tse Lin , Chu-Fu Lin , Chien-Li Kuo , Yung-Chang Lin
- Applicant: UNITED MICROELECTRONICS CORP.
- Applicant Address: TW Science-Based Industrial Park, Hsin-Chu
- Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee Address: TW Science-Based Industrial Park, Hsin-Chu
- Agent Winston Hsu; Scott Margo
- Main IPC: H01L23/00
- IPC: H01L23/00 ; H01L21/768 ; H01L23/48 ; H01L23/498 ; H01L23/522 ; H01L49/02

Abstract:
The present invention provides a method of forming a chip with TSV electrode. A substrate with a first surface and a second surface is provided. A thinning process is performed from a side of the second surface so the second surface becomes a third surface. Next, a penetration via which penetrates through the first surface and the third surface is formed in the substrate. A patterned material layer is formed on the substrate, wherein the patterned material layer has an opening exposes the penetration via. A conductive layer is formed on the third surface thereby simultaneously forming a TSV electrode in the penetration via and a surface conductive layer in the opening.
Public/Granted literature
- US20140203394A1 Chip With Through Silicon Via Electrode And Method Of Forming The Same Public/Granted day:2014-07-24
Information query
IPC分类: