Invention Grant
- Patent Title: Connected mode gap measurement for LTE TDD
- Patent Title (中): LTE TDD的连接模式间隙测量
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Application No.: US13779691Application Date: 2013-02-27
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Publication No.: US09131389B2Publication Date: 2015-09-08
- Inventor: Jun Won Choi , Raghu Narayan Challa
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM INCORPORATED
- Current Assignee: QUALCOMM INCORPORATED
- Current Assignee Address: US CA San Diego
- Agency: Seyfarth Shaw LLP
- Main IPC: H04W24/00
- IPC: H04W24/00 ; H04L25/02

Abstract:
A method of wireless communication includes selecting three or more reference signal symbols from at least two subframes detected within a measurement window location during a connected mode gap. The selected reference signal symbols are selected from reference signal symbols of at least one non-MBSFN subframe and one reference signal symbol of a special subframe. The method also includes combining the selected reference signal symbols and estimating a reference signal received power (RSRP) based at least in part on a result of the combining.
Public/Granted literature
- US20130223256A1 CONNECTED MODE GAP MEASUREMENT FOR LTE TDD Public/Granted day:2013-08-29
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